AOI-JX170是针对光模块产品外观缺陷检查及金线检测所开发的检测设备。

AOI-JX170 is an inspection equipment developed for appearance defect inspection and gold wire detection in optical module products.

设备以高精密运动平台为核心，采用 AI深度算法智能引擎，依托公司多年的缺陷检测领域积累，设备具有高素质的成像能力，独有的AI算法高效识别缺陷、全种类的自由缺陷学习氛围、全场场景的生产信息界面，多工艺融合的产品配置场景，大容量的远程离线复判系统，定制化的MES系统对接等优势。

With a high-precision motion platform as its core, the equipment adopts an AI deep learning algorithm intelligent engine. Based on the company's many years of experience in the field of defect inspection, the equipment boasts high-quality imaging capabilities, unique AI algorithms for efficient defect recognition, a flexible learning environment for all types of defects, a production information interface covering all scenarios, product configuration scenarios integrating multiple processes, a high-capacity remote offline review system, customized MES system integration, and other advantages.

本设备支持常用物料的LD区域、TIA区域、SUB区域、PD区域的检测，包括检测脏污、破损、裂纹、划痕等。以及对金线的塌陷、线高和金球直径等缺陷进行检测。

This equipment supports the inspection of common materials in LD, TIA, SUB, and PD areas, including the detection of dirt, damage, cracks, scratches, and other defects. It also inspects defects such as gold wire collapse, wire height, and gold ball diameter.