AOI-COC030是针对COC/COS/CHIP/热沉产品外观缺陷检查及清洗，所开发的多面检测清洗设备。

AOI-COC030 is a multi-faceted inspection and cleaning equipment developed specifically for the visual inspection of defects and cleaning of COC/COS/CHIP/heat sink products.

设备以高精密运动平台为核心，采用 AI深度算法智能引擎，依托公司多年的缺陷检测领域积累，设备具有高素质的成像能力，独有的AI算法高效识别缺陷、全种类的自由缺陷学习氛围、全场场景的生产信息界面，多工艺融合的产品配置场景，大容量的远程离线复判系统，定制化的MES系统对接等优势。

Centered around a high-precision motion platform, the equipment utilizes an AI deep learning algorithm intelligent engine. Building upon the company's years of experience in defect inspection, this equipment boasts high-quality imaging capabilities, unique AI algorithms for efficient defect recognition, a comprehensive learning environment for all types of defects, a production information interface covering all scenarios, product configuration scenarios integrating multiple processes, a large-capacity remote offline re-inspection system, and customized MES system integration, among other advantages.

本设备支持常用物料的多面缺陷检测及AR面清洗，包括检测脏污、破损、裂纹、划痕、区域异色、图形异常、尺寸异常等外观瑕疵，检测范围包含正面、背面，两个侧腔面、金线塌陷、金线扭曲。

This equipment supports multi-faceted defect inspection and AR surface cleaning for commonly used materials, including the detection of external flaws such as dirt, damage, cracks, scratches, discoloration in specific areas, graphical anomalies, dimensional irregularities, as well as gold wire collapse and distortion. The inspection covers the front, back, both side cavity surfaces, and the AR surface.

特别是光通信芯片领域，脊区生长异常、金属层气泡、脊区损伤等特殊类型瑕疵成像和检出效果明显优于同品类产品；雪花清洗组件结合检测结果的融合，精准的对产品AR面浮尘类轻粘附脏污进行清洗。

Especially in the field of optical communication chips, the imaging and detection effects for special types of defects such as abnormal ridge growth, metal layer bubbles, and ridge damage are significantly superior to those of similar products. The snowflake cleaning module, combined with the fusion of inspection results, precisely cleans light adhesion dirt such as floating dust on the AR surface of the product.