AOI-DF1016芯片单面检测设备用于芯片外观缺陷检测，采用6/8寸子母环上料，设备以大理石与钢为主体结构，使用高精度的视觉定位机构，具有高精度、高稳定性等特点。
AOI-DF1016 Chip Single-Side Inspection Machine is designed for external defects inspection of chip components. It supports loading via 6-inch and 8-inch nested rings. Built with marble and steel as the main structure and equipped with high-precision visual positioning mechanism, the machine features outstanding high precision and excellent stability.
设备检测流程涵盖人工上料、预扫定位、自动对焦拍照和结果输出等环节。配备高精度视觉定位机构，结合先进的自动对焦系统，能够对芯片进行精准定位，自动调整焦距并进行拍照。
Its inspection workflow includes manual feeding, pre-scan positioning, auto-focus imaging and result output. Integrated with high-precision visual positioning and advanced auto-focus system, it achieves accurate chip positioning, automatic focal length adjustment and image capturing.
通过高效的 AI 算法对拍摄的图像进行深入分析处理，并以报表的形式清晰直观地展示芯片检测数据，如缺陷类别、缺陷所处位置等关键信息，为操作人员后续的处理工作提供数据支持，助力芯片生产质量的把控与提升。
Captured images are deeply analyzed and processed by efficient AI algorithms. Key inspection data such as defect types and defect positions are displayed intuitively in report forms, providing solid data support for subsequent operations and effectively controlling and improving chip production quality.
