AOI-TE70是一款专为 COS 激光芯片性能检测而精心打造的先进设备。极大地提升了检测效率，具备高度兼容性，既能满足 CW 模式下的检测需求，也能完美适配 QCW 模式。

AOI-TE70 is an advanced system meticulously engineered for performance evaluation of COS laser chips. This cutting-edge equipment significantly enhances testing efficiency while demonstrating exceptional compatibility, seamlessly supporting both Continuous Wave (CW) and Quasi-Continuous Wave (QCW) operational modes.

在检测参数方面，堪称全面且精准，可同时对激光芯片的多项关键指标进行测试,，包括偏振、功率、波长、阈值电流（Ith）、斜率效率（SE）、电压（Volt）、工作电流（Iop）、工作电压（Vop）、开启电压（Von）、冷波长、热波长、波峰高度、光电转换效率以及 PBS 等参数。

Featuring comprehensive metrological capabilities, the system enables simultaneous characterization of multiple critical laser chip parameters,including:

Polarization properties

Optical power output

Lasing wavelength (cold/thermal states)

Threshold current

Slope efficiency (SE)

Forward voltage

Operating current and voltage

Turn-on voltage

Spectral characteristics (peak wavelength, spectral shift, and peak intensity)

Power conversion efficiency (PCE)

Polarization beam splitting (PBS) performance

通过该设备的检测，能够精准地掌握 COS 激光芯片的性能状况，为芯片的质量把控和优化改进提供坚实的数据支持。

This multiparameter analysis platform provides precise quantification of COS laser chip behaviors, establishing a robust data foundation for quality assurance, process optimization, and device reliability enhancement. The system's integrated measurement architecture ensures traceable compliance with semiconductor laser testing standards while enabling high-throughput production line implementation.